Wentsler LLC is committed to educating the intellectual property community about important aspects of patent law that can impact effectiveness in pursuing patent issuance and protection both domestically and internationally. Presentations are delivered on-site as a service to companies and other organizations that share our commitment.

int_presentationPatent Application Drafting Techniques

Review techniques to draft patent applications with broad claim scope while avoiding subsequent issues during prosecution before the United States Patent and Trademark Office and potential challenges to the validity and/or enforceability of the resulting issued patent.

U.S. Patent Application Drafting Considerations for Subsequent Foreign Filing

Learn how to draft applications that can avoid unique pitfalls frequently encountered when subsequently filing the application in various foreign countries. Particular attention will be directed to avoiding issues commonly encountered in Japan, Korea, China, Taiwan and countries of Europe.

Expediting Patent Prosecution before the United States Patent and Trademark Office

Learn various patent prosecution strategies designed to reduce pendency of the patent applications before the United States Patent and Trademark Office and minimize patent prosecution costs.

U.S. Patent Prosecution: Examiner’s Perspective

Many decisions by examiners during prosecution may be influenced by minimum productivity requirements, productivity incentives and patent examination quality imposed by the United States Patent and Trademark Office. The presentation will review the examiner count system, the examiner bonus system and quality review program to help learn how examiners view various aspects of patent prosecution.

Targeted Patent Prior Art Search Strategies

Learn various search techniques designed to quickly discover the most relevant U.S. patents and U.S. patent application publications from the United States Patent and Trademark Office.

Contact Wentsler for more information about our presentations.